Mountains 1.2

Unprecedented surface analysis power, instrument-oriented and universal solutions, greater interactivity, 24 bit graphics, national and ISO standards, and more.
Even faster, greater interoperability, enhanced sub-surface analysis, wavelets analysis, integration of additional standards, and more.
Unequalled range of surface analysis solutions dedicated to different instrument families: tactile and optical scanning profilers, confocal laser scanning microscopes, white light interferometers, scanning probe microscopes, optical microscopes, form and contour measurement systems, scattered light measurement instruments, imaging systems, workshop roughness meters, and other surface metrology instruments.
Work faster and more intuitively thanks to redesigned 32x32 icons, reorganized and simplified toolbars that can be located anywhere in your work space, and new panels providing direct access to operator and study icons.
Navigate almost instantaneously in long analysis documents using the interactive page viewer that allows you to go directly to any frame on a page. Use it to drag pages to change page order and to delete all blank pages with a single click.
IIn Mountains the user interface is available in Brazilian Portuguese bringing the number of languages supported to ten. Note that while the user interface is available in ten languages, the Help files are displayed in English when Italian, Chinese, Polish, Korean and Portuguese are selected.
Use wavelets of different families – defined by a wavelet function and a scaling function – to decompose a 2D (x, z) profile or 3D (x, y, z) surface into a set of profiles or surfaces at different levels of scale using Coiflet, Daubechies, Discrete Meyer, Spline and Symlet wavelet families.